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PD - 9.529B
IRCZ44
HEXFET(R) Power MOSFET
l l l l l l
Dynamic dv/dt Rating Current Sense 175C Operating Temperature Fast Switching Ease of Paralleling Simple Drive Requirements
VDSS = 60V RDS(on) = 0.028 ID = 50*A
Description
Third Generation HEXFETs from International Rectifier provide the designer with the best combination of fast switching, ruggedized device, low on-resistance and cost-effectiveness. The HEXSense device provides an accurate fraction of the drain current through the additional two leads to be used for control or protection of the device. These devices exhibit similar electrical and thermal characteristics as their IRF-series equivalent part numbers. The provision of a kelvin source connection effectively eliminates problems of common source inductance when the HEXSence is used as a fast, high-current switch in non current-sensing applications.
TO-220 HexSense
Absolute Maximum Ratings
Parameter
ID @ TC = 25C ID @ TC = 100C IDM PD @TC = 25C VGS EAS dv/dt TJ TSTG Continuous Drain Current, VGS @ 10V Continuous Drain Current, VGS @ 10V Pulsed Drain Current Power Dissipation Linear Derating Factor Gate-to-Source Voltage Single Pulse Avalanche Energy Peak Diode Recovery dv/dt Operating Junction and Storage Temperature Range Soldering Temperature, for 10 seconds Mounting Torque, 6-32 or M3 screw
Max.
50* 37 210 150 1.0 20 30 4.5 -55 to + 175 300 (1.6mm from case) 10 lbf*in (1.1 N*m)
Units
A W W/C V mJ V/ns C
Thermal Resistance
Parameter
RJC RCS RJA Junction-to-Case Case-to-Sink, Flat, Greased Surface Junction-to-Ambient --
Min.
-- -- --
Typ.
-- 0.50 --
Max.
1.0 -- 62
Units
C/W
C-13
IRCZ44
Electrical Characteristics @ TJ = 25C (unless otherwise specified)
Parameter Drain-to-Source Breakdown Voltage V(BR)DSS/TJ Breakdown Voltage Temp. Coefficient RDS(ON) Static Drain-to-Source On-Resistance VGS(th) Gate Threshold Voltage gfs Forward Transconductance V(BR)DSS IDSS IGSS Qg Qgs Qgd td(on) tr td(off) tf LD LC Ciss Coss Crss r Coss Drain-to-Source Leakage Current Gate-to-Source Forward Leakage Gate-to-Source Reverse Leakage Total Gate Charge Gate-to-Source Charge Gate-to-Drain ("Miller") Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Internal Drain Inductance Internal Source Inductance Input Capacitance Output Capacitance Reverse Transfer Capacitance Current Sensing Ratio Output Capacitance of Sensing Cells Min. 60 --- --- 2.0 18 --- --- --- --- --- --- --- --- --- --- --- --- --- --- --- --- 2460 --- Typ. --- 0.060 --- --- --- --- --- --- --- --- --- --- 19 120 55 86 4.5 7.5 2500 1200 200 --- 9.0 Max. Units Conditions --- V VGS = 0V, ID = 250A --- V/C Reference to 25C, ID = 1mA 0.028 VGS = 10V, ID = 31A 4.0 V VDS = VGS, ID = 250A --- S VDS = 25V, ID = 31A 25 VDS = 60V, VGS = 0V 250 VDS = 48V, VGS = 0V, TJ = 150C 100 VGS = 20V -100 VGS = -20V 95 ID = 52A 27 nC VDS = 48V 46 VGS = 10V, See Fig. 6 and 13 --- VDD = 30V --- ID = 52A --- RG = 9.1 --- RD = 0.54, See Fig. 10 --- nH --- --- --- --- 2720 --- Between lead, 6 mm (0.25in.) from package and center of die contact VGS = 0V VDS = 25V = 1.0MHz, See Fig. 5 ID = 52A, VGS = 10V VGS = 0V, VDS = 25V, = 1.0MHz
pF --- pF
Source-Drain Ratings and Characteristics
IS
I SM
V SD t rr Qrr ton Notes:
Parameter Continuous Source Current (Body Diode) Pulsed Source Current (Body Diode) Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge Forward Turn-On Time
Min. Typ. Max. Units --- --- --- --- --- --- --- --- 140 1.2 50* A 210 2.5 300 2.8 V ns nC
Conditions MOSFET symbol showing the G integral reverse p-n junction diode. TJ = 25C, IS = 52A, VGS = 0V TJ = 25C, IF = 52A di/dt = 100A/s
D
S
Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
Repetitive rating; pulse width limited by
max. junction temperature. ( See fig. 11 )
ISD 52A, di/dt 250A/s, VDD V(BR)DSS,
TJ 175C
VDD = 25V, starting TJ = 25C, L = 0.013mH
RG = 25, IAS = 52A. (See Figure 12)
Pulse width 300s; duty cycle 2%.
C-14
IRCZ44
ID, Drain Current (Amps)
VDS, Drain-to-Source Voltage (Volts) Fig. 1 Typical Output Characteristics, TC=25C
ID, Drain Current (Amps) VDS, Drain-to-Source Voltage (Volts) Fig. 2 Typical Output Characteristics, TC=175C VDS, Gate-to-Source Voltage (Volts) RDS(on), Drain to Source On-Resistance (Normalized)
ID, Drain Current (Amps)
TJ, Junction Temperature (C) Fig. 4 Normalized On-Resistance vs. Temperature
Fig. 3 Typical Transfer Characteristics
C-15
IRCZ44
VDS, Drain-to-Source Voltage (Volts) Fig. 5 Typical Capacitance vs. Drain-toSource Voltage
VGS, Gate-to-Source Voltage (Volts)
Capacitance (pF)
QG, Total Gate Charge (nC) Fig. 6 Typical Gate Charge vs. Gate-toSource Voltage
ISD, Reverse Drain Current (Amps)
VSD, Source-to-Drain Voltage (Volts) Fig. 7 Typical Source-Drain Diode Forward Voltage
ID Drain Current (Amps) VDS, Drain-to-Source Voltage (Volts) Fig. 8 Maximum Safe Operating Area
C-16
IRCZ44
ID, Drain Current (Amps)
TC, Case Temperature (C) Fig. 9 Maximum Drain Current vs. Case Temperature
ID, Drain Current (Amps) Starting TJ, Junction Temperature (C) Fig. 12c Maximum Avalanche Energy vs. Drain Current t1, Rectiangular Pulse Duration (seconds) Fig. 11 Maximum Effective Transient Thermal Impedance, Junction-to-Case
C-17
Thermal Repsonse (ZJC)
IRCZ44
Sense Ratio (r)
Sense Ratio (r)
TJ, Junction Temperature (C) Fig. 15 Typical HEXSense Ratio vs. Junction Temperature
ID, Drain Current (Amps) Fig. 16 Typical HEXSense Ratio vs. Drain Current
Sense Ratio (r)
Fig. 18 HEXSense Ratio Test Circuit
VGS, Gate-to-Source Voltage (Volts) Fig. 17 Typical HEXSense Ratio vs. Gate Voltage Mechanical drawings, Appendix A Part marking information, Appendix B Test Circuit diagrams, Appendix C
C-18
Fig. 19 HEXSense Sensing Cell Output Capacitance Test Circuit

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